Search Results - Gauvin, Raynald

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    Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

    Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization / by Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald

    Published Springer Nature Singapore : Imprint: Springer, 2018.
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