Search Results - Lu, Toh-Ming

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    Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms /

    Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms / by Borja, Juan Pablo, Lu, Toh-Ming, Plawsky, Joel

    Published 2016
    Full-text access
    View in OPAC
    e-Book

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