Goldstein, J., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and x-ray microanalysis (fourth edition.). Springer.
Chicago Style (17th ed.) CitationGoldstein, Joseph, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-ray Microanalysis. fourth edition. New York: Springer, 2018.
MLA (9th ed.) CitationGoldstein, Joseph, et al. Scanning Electron Microscopy and X-ray Microanalysis. fourth edition. Springer, 2018.
Warning: These citations may not always be 100% accurate.