APA (7. basım) Alıntı

Goldstein, J., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and x-ray microanalysis (fourth edition.). Springer.

Chicago Style (17. basım) Atıf

Goldstein, Joseph, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, ve David C. Joy. Scanning Electron Microscopy and X-ray Microanalysis. fourth edition. New York: Springer, 2018.

MLA (9th ed.) Atıf

Goldstein, Joseph, et al. Scanning Electron Microscopy and X-ray Microanalysis. fourth edition. Springer, 2018.