Scanning electron microscopy and x-ray microanalysis /

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Bibliographic Details
Main Author: Goldstein, Joseph
Other Authors: Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W. M., Scott, John Henry J., Joy, David C.
Format: Book
Language:English
Published: New York : Springer, 2018
Edition:fourth edition.
Subjects:
Tarayıcı elektron mikroskopları.
Scanning electron microscopes.
X-ışını mikroskopisi.
X-ray microscopy.

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