Optimal reliability design : fundamentals and applications /

Bibliographic Details
Other Authors: Kuo, Way, Prasad, V. Rajendra, Tilman, Frank A., Hwang, Ching-lai
Format: Book
Language:English
Published: Cambridge, UK ; New York, NY : Cambridge University Press, 2001.
Subjects:
Reliability (Engineering).
Güvenilirlik (Mühendislik).
Description
Item Description:Dizin : 385-389 s.
Physical Description:xx, 389 sayfa ; 26 cm.
Bibliography:Kaynakça : 367-384 s.
ISBN:0521781272
9780521031912

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