Optimal reliability design : fundamentals and applications - Kuo, Way.; Prasad, V. Rajendra; Tilman, Frank A.; Hwang, Ching-lai. (Cambridge, UK ; New York, NY : Cambridge University Press, 2001)
Dizin : 385-389 s.
Kaynakça : 367-384 s.
Keywords: Reliability (Engineering).; Güvenilirlik (Mühendislik).