APA (7. basım) Alıntı

Beyerer, J., Richter, M., & Nagel, M. (2018). Pattern recognition: Introduction, features, classifiers and principles (First edition.). Walter de Gruyter GmbH.

Chicago Style (17. basım) Atıf

Beyerer, Jürgen, Matthias Richter, ve Matthias Nagel. Pattern Recognition: Introduction, Features, Classifiers and Principles. First edition. Berlin ; Boston: Walter de Gruyter GmbH, 2018.

MLA (9th ed.) Atıf

Beyerer, Jürgen, et al. Pattern Recognition: Introduction, Features, Classifiers and Principles. First edition. Walter de Gruyter GmbH, 2018.