Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and STEM /

In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main...

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Bibliographic Details
Main Author: Tanaka, Nobuo (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Tokyo : Springer Japan : 2017.
Imprint: Springer,
Edition:1st ed. 2017.
Subjects:
Materials > Analysis.
Spectrum analysis.
Nanoscience.
Characterization and Analytical Technique.
Spectroscopy.
Nanophysics.
Online Access:Full-text access

Internet

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