Reliability Physics and Engineering Time-To-Failure Modeling /

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information con...

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Detaylı Bibliyografya
Yazar: McPherson, J. W. (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2019.
Imprint: Springer,
Edisyon:3rd ed. 2019.
Konular:
Electronic circuits.
Security systems.
Electronic Circuits and Systems.
Security Science and Technology.
Online Erişim:Full-text access
İçindekiler:
  • Introduction
  • Physics of Degradation
  • Time Dependence of Materials and Device Degradation
  • From Material/Device Degradation to Time-To-Failure
  • Time-To-Failure Modeling
  • Gaussian Statistics - An Overview
  • Time-To-Failure Statistics
  • Failure Rate Modeling
  • Accelerated Degradation
  • Acceleration Factor Modeling
  • Ramp-To-Failure Testing
  • Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
  • Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering
  • Conversion of Dynamical Stresses Into Effective Static Values
  • Resonance and Resonance-Induced Degradation
  • Increasing the Reliability of Device/Product Designs
  • Screening
  • Heat Generation and Dissipation
  • Sampling Plans and Confidence Intervals
  • .

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