Test Generation of Crosstalk Delay Faults in VLSI Circuits

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

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Detaylı Bibliyografya
Asıl Yazarlar: Jayanthy, S. (Yazar), Bhuvaneswari, M.C (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Singapore : Springer Nature Singapore : 2019.
Imprint: Springer,
Edisyon:1st ed. 2019.
Konular:
Electronic circuits.
Microprogramming .
Computers.
Logic design.
Electronic Circuits and Systems.
Control Structures and Microprogramming.
Hardware Performance and Reliability.
Logic Design.
Online Erişim:Full-text access
İçindekiler:
  • Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects
  • Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults
  • Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm
  • Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm
  • Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization
  • Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model
  • Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.

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