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Metal Impurities in Silicon- and Germanium-Based Technologies Origin, Characterization, Control, and Device Impact /

This book gives a unique review of different aspects of metallic contaminations in Si and Ge-based semiconductors. All important metals are discussed including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on...

Detaylı Bibliyografya
Asıl Yazarlar:	Claeys, Cor (Yazar), Simoen, Eddy (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing : 2018. Imprint: Springer,
Edisyon:	1st ed. 2018.
Seri Bilgileri:	Springer Series in Materials Science, 270
Konular:	Optical materials. Telecommunication. Semiconductors. Electronic circuits. Materials > Analysis. Optical Materials. Microwaves, RF Engineering and Optical Communications. Electronic Circuits and Systems. Characterization and Analytical Technique.
Online Erişim:	Full-text access

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