Timing Performance of Nanometer Digital Circuits Under Process Variations

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...

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Bibliographic Details
Main Authors: Champac, Victor (Author), Garcia Gervacio, Jose (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Frontiers in Electronic Testing ; 39
Subjects:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronics.
Electronic Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Access:Full-text access
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Table of Contents:
  • Introduction
  • Mathematical Fundamentals
  • Process Variations
  • Gate delay under process variations
  • Path Delay Under Process Variations
  • Circuit Analysis under Process Variations
  • FinFET Technology and design issues.

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