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Timing Performance of Nanometer Digital Circuits Under Process Variations
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...
Main Authors: | , |
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Corporate Author: | |
Format: | e-Book |
Language: | English |
Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2018.
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Edition: | 1st ed. 2018. |
Series: | Frontiers in Electronic Testing ;
39 |
Subjects: | |
Online Access: | Full-text access View in OPAC |
Internet
Full-text accessView in OPAC
Merkez Kütüphane
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