APA (7. basım) Alıntı

Posser, G., Sapatnekar, S. S., & Reis, R. (2017). Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS (1st ed. 2017.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-48899-8

Chicago Style (17. basım) Atıf

Posser, Gracieli, Sachin S. Sapatnekar, ve Ricardo Reis. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. 1st ed. 2017. Cham: Springer International Publishing : Imprint: Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.

MLA (9th ed.) Atıf

Posser, Gracieli, et al. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. 1st ed. 2017. Springer International Publishing : Imprint: Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.