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Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS /

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

Detaylı Bibliyografya
Asıl Yazarlar:	Posser, Gracieli (Yazar), Sapatnekar, Sachin S. (Yazar), Reis, Ricardo (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing : 2017. Imprint: Springer,
Edisyon:	1st ed. 2017.
Konular:	Electronic circuits. Microprocessors. Computer architecture. Electronic Circuits and Systems. Processor Architectures.
Online Erişim:	Full-text access

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