Loading…
Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS /
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...
| Main Authors: | , , |
|---|---|
| Corporate Author: | |
| Format: | e-Book |
| Language: | English |
| Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2017.
|
| Edition: | 1st ed. 2017. |
| Subjects: | |
| Online Access: | Full-text access View in OPAC |