APA (7. basım) Alıntı

Sayil, S. (2018). Contactless VLSI Measurement and Testing Techniques (1st ed. 2018.). Springer International Publishing. https://doi.org/10.1007/978-3-319-69673-7

Chicago Style (17. basım) Atıf

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Cham: Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-69673-7.

MLA (9th ed.) Atıf

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-69673-7.