APA (7th ed.) Citation

Sayil, S. (2018). Contactless VLSI Measurement and Testing Techniques (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-69673-7

Chicago Style (17th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-69673-7.

MLA (9th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-69673-7.