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Contactless VLSI Measurement and Testing Techniques
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...
Main Author: | Sayil, Selahattin (Author) |
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Corporate Author: | SpringerLink (Online service) |
Format: | e-Book |
Language: | English |
Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2018.
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Edition: | 1st ed. 2018. |
Subjects: | |
Online Access: | Full-text access View in OPAC |
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