Industrial X-Ray Computed Tomography

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Carmignato, Simone (Editor), Dewulf, Wim (Editor), Leach, Richard (Editor)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : 2018.
Imprint: Springer,
Edition:1st ed. 2018.
Subjects:
Materials > Analysis.
Manufactures.
Optical materials.
Atoms.
Molecules.
Characterization and Analytical Technique.
Machines, Tools, Processes.
Optical Materials.
Atomic, Molecular and Chemical Physics.
Online Access:Full-text access
Description
Summary:This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
Physical Description:VII, 369 p. 273 illus. online resource.
ISBN:9783319595733
DOI:10.1007/978-3-319-59573-3

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