Industrial X-Ray Computed Tomography

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

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Detaylı Bibliyografya
Müşterek Yazar: SpringerLink (Online service)
Diğer Yazarlar: Carmignato, Simone (Editör), Dewulf, Wim (Editör), Leach, Richard (Editör)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2018.
Imprint: Springer,
Edisyon:1st ed. 2018.
Konular:
Materials > Analysis.
Manufactures.
Optical materials.
Atoms.
Molecules.
Characterization and Analytical Technique.
Machines, Tools, Processes.
Optical Materials.
Atomic, Molecular and Chemical Physics.
Online Erişim:Full-text access
İçindekiler:
  • Introduction
  • Principles of X-ray computed tomography
  • Technical concepts and components
  • Processing and visualization of CT data
  • Computer simulation
  • Error sources
  • Performance verification
  • Traceability of CT dimensional measurements
  • CT for non-destructive testing and materials characterization
  • CT for dimensional metrology
  • Other industrial applications.

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