APA (7th ed.) Citation

Chen, Z. (2017). Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods (1st ed. 2017.). Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg. https://doi.org/10.1007/978-3-658-16756-1

Chicago Style (17th ed.) Citation

Chen, Zhiwen. Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. 1st ed. 2017. Wiesbaden: Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg, 2017. https://doi.org/10.1007/978-3-658-16756-1.

MLA (9th ed.) Citation

Chen, Zhiwen. Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. 1st ed. 2017. Springer Fachmedien Wiesbaden : Imprint: Springer Vieweg, 2017. https://doi.org/10.1007/978-3-658-16756-1.