APA (7. basım) Alıntı

Lienig, J., & Thiele, M. (2018). Fundamentals of Electromigration-Aware Integrated Circuit Design (1st ed. 2018.). Springer International Publishing. https://doi.org/10.1007/978-3-319-73558-0

Chicago Style (17. basım) Atıf

Lienig, Jens, ve Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. 1st ed. 2018. Cham: Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-73558-0.

MLA (9th ed.) Atıf

Lienig, Jens, ve Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. 1st ed. 2018. Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-73558-0.