Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensiv...

Ful tanımlama

Detaylı Bibliyografya
Asıl Yazarlar: Lienig, Jens (Yazar), Thiele, Matthias (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2018.
Imprint: Springer,
Edisyon:1st ed. 2018.
Konular:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronics.
Electronic Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Erişim:Full-text access
İçindekiler:
  • Introduction
  • Fundamentals of Electromigration
  • Integrated Circuit Design and Electromigration
  • Mitigating Electromigration in Physical Design
  • Summary and Outlook.

Benzer Materyaller