Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrate /

This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching...

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Bibliographic Details
Main Authors: Buccella, Pietro (Author), Stefanucci, Camillo (Author), Kayal, Maher (Author), Sallese, Jean-Michel (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Analog Circuits and Signal Processing,
Subjects:
Electronic circuits.
Electronics.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Online Access:Full-text access
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Table of Contents:
  • Chapter1: Overview of Parasitic Substrate Coupling
  • Chapter2: Design Challenges in High Voltage ICs
  • Chapter3: Substrate Modeling with Parasitic Transistors
  • Chapter4: TCAD Validation of the Model
  • Chapter5: Extraction Tool for the Substrate Network
  • Chapter6: Parasitic Bipolar Transistors in Benchmark Structures
  • Chapter7: Substrate Coupling Analysis and Evaluation of Protection Strategies.

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