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Compendium of Surface and Interface Analysis
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various...
| Müşterek Yazar: | |
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| Diğer Yazarlar: | |
| Materyal Türü: | e-Kitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Singapore :
Springer Nature Singapore :
2018.
Imprint: Springer, |
| Edisyon: | 1st ed. 2018. |
| Konular: | |
| Online Erişim: | Full-text access |
İçindekiler:
- Acoustic Microscopy
- Action Spectroscopy with STM
- Ambient Pressure X-ray Photoelectron Spectroscopy
- Angle-resolved Ultraviolet Photoelectron Spectroscopy
- Atom Probe Field Ion Microscope
- Atomic Force Microscope
- Auger electron spectroscopy
- Cathodoluminescence
- Conductive Atomic Force Microscopy
- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy
- Dynamic Secondary Ion Mass Spectrometry
- Elastic Recoil Detection Analysis
- Electrochemical Atomic Force Microscopy
- Electrochemical Infrared Spectroscopy
- Electrochemical Scanning Tunneling Microscopy
- Electrochemical Second Harmonic Generation
- Electrochemical Sum Frequency Generation
- Electrochemical Surface X-ray Scattering
- Electrochemical Transmission Electron Microscopy
- Electrochemical X-ray Absorption Fine Structure
- Electrochemical X-ray Photoelectron Spectroscopy
- Electron Backscatter Diffraction
- Electron Energy Loss Spectroscopy
- Electron Probe Microanalysis
- Electron Stimulated Desorption
- Electron-beam-induced current
- Ellipsometry
- Environmental SEM (Atmospheric SEM)
- Environmental Transmission Electron Microscopy
- Extended X-ray Absorption Fine Structure
- Focused Ion Beam Scanning Electron Microscope
- Force Curve
- Force Spectroscopy
- Frequency-Modulation Atomic Force Microscopy
- Gap Mode Raman Spectroscopy
- Glow Discharge Mass Spectrometry
- Glow Discharge Optical Emission Spectrometry
- Hard X-ray Photoelectron Spectroscopy
- Helium Atom Scattering
- High-resolution Elastic Recoil Detection Analysis
- High-resolution electron energy loss spectroscopy
- High-resolution Rutherford Backscattering Spectrometry
- High-Speed Atomic Force Microscopy
- Imaging Ellipsometry
- Impact Collision Ion Scattering Spectroscopy
- Inelastic Electron Tunneling Spectroscopy
- Infrared External-Reflection Spectroscopy
- Infrared Reflection Absorption Spectroscopy
- Interferometer displacement measurement
- Inverse Photoemission Spectroscopy
- Kelvin Probe Force Microscope
- Laser Ionization Secondary Neutral Mass Spectrometry
- Laser Photoelectron Spectroscopy
- Lateral Force Microscopy
- Liquid SPM/AFM
- Low Energy Ion Scattering Spectroscopy
- Low-Energy Electron Diffraction
- Low-Energy Electron Microscope
- Magnetic Force Microscopy
- Matrix-Assisted Laser Desorption/Ionization
- Medium Energy Ion Scattering
- Micro Raman Spectroscopy
- Microprobe Reflection High Energy Electron Diffraction
- Multiple-probe Scanning Probe Microscope
- Nanoscale Angle-resolved Photoelectron Spectroscopy
- Nonlinear Spectroscopy
- Nuclear Reaction Analysis
- Optical Microscopy
- Optical second harmonic generation spectroscopy and microscopy
- Particle Induced X-ray Emission
- Penning Ionization Electron Spectroscopy
- Phase Mode SPM/AFM
- Photoelectron diffraction
- Photoelectron holography
- Photoelectron Yield Spectroscopy
- Photoemission Electron Microscope
- Photoluminescence
- Photon Emission from the Scanning Tunneling Microscope
- Photo-StimulatedDesorption
- Piezoresponse Force Microscope
- Positron-Annihilation-Induced Desorption
- p-Polarized Multiple-Angle Incidence Resolution Spectrometry
- Quartz Crystal Microbalance
- Reflectance Difference Spectroscopy
- Reflection High-Energy Electron Diffraction
- Resonant Inelastic X-ray Scattering
- Rutherford Backscattering Spectrometry
- Scanning Capacitance Microscopy
- Scanning Electrochemical Microscopy
- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry
- Scanning Electron Microscopy
- Scanning Helium Ion Microscope
- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy
- Scanning Probe Microscopy
- Scanning Transmission Electron Microscopy
- Scanning Transmission X-ray Microscopy
- Scanning Tunneling Microscopy
- Scanning Tunneling Spectroscopy
- Soft X-ray Absorption Fine Structure
- Spectroscopic Ellipsometry
- Spin- and Angle-resolved Photoelectron Spectroscopy
- Spin-Polarized Scanning Electron Microscopy
- Spin-Polarized ScanningTunneling Microscopy
- Spin-resolved Photoemission Electron Microscopy
- Super-resolution Microscopy
- Surface acoustic wave
- Surface Enhanced Raman Scattering
- Surface Magneto-optic Kerr Effect
- Surface Plasmon Resonance
- Surface Profilometer
- Surface Sensitive Scanning Electron Microscopy
- Surface X-ray Diffraction
- Surface-enhanced Infrared Absorption Spectroscopy
- Synchrotron Radiation Photoelectron Spectroscopy
- Synchrotron Scanning Tunneling Microscope
- Thermal desorption spectroscopy
- Time-of-Flight Secondary Ion Mass Spectrometry
- Time-resolved Photoelectron Spectroscopy
- Time-resolved Photoemission Electron Microscopy
- Time-resolved Scanning Tunneling Microscopy
- Tip-Enhanced Raman Scattering
- Total Reflection X-Ray Fluorescence
- Transmission Electron Diffraction
- Transmission Electron Microscope
- Ultraviolet Photoelectron Spectroscopy
- Ultraviolet-visible spectrophotometry
- Vibrational Sum Frequency Generation Spectroscopy
- X-ray Absorption Near Edge Structure
- X-ray aided noncontact atomic force microscopy
- X-ray Crystal Truncation Rod Scattering
- X-ray Magnetic Circular Dichroism
- X-ray Photoelectron Spectroscopy
- X-Ray Reflectivity
- X-ray Standing Wave Method.