Brodusch, N., Demers, H., & Gauvin, R. (2018). Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (1st ed. 2018.). Springer Nature Singapore. https://doi.org/10.1007/978-981-10-4433-5
Chicago Style (17. basım) AtıfBrodusch, Nicolas, Hendrix Demers, ve Raynald Gauvin. Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization. 1st ed. 2018. Singapore: Springer Nature Singapore, 2018. https://doi.org/10.1007/978-981-10-4433-5.
MLA (9th ed.) AtıfBrodusch, Nicolas, et al. Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization. 1st ed. 2018. Springer Nature Singapore, 2018. https://doi.org/10.1007/978-981-10-4433-5.
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