Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

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Detaylı Bibliyografya
Asıl Yazarlar: Brodusch, Nicolas (Yazar), Demers, Hendrix (Yazar), Gauvin, Raynald (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Singapore : Springer Nature Singapore : 2018.
Imprint: Springer,
Edisyon:1st ed. 2018.
Seri Bilgileri:SpringerBriefs in Applied Sciences and Technology,
Konular:
Materials > Analysis.
Spectrum analysis.
Microtechnology.
Microelectromechanical systems.
Characterization and Analytical Technique.
Spectroscopy.
Microsystems and MEMS.
Online Erişim:Full-text access
Diğer Bilgiler
Özet:This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
Fiziksel Özellikler:XII, 137 p. 53 illus., 20 illus. in color. online resource.
ISBN:9789811044335
ISSN:2191-5318
DOI:10.1007/978-981-10-4433-5

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