Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

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Bibliographic Details
Main Authors: Brodusch, Nicolas (Author), Demers, Hendrix (Author), Gauvin, Raynald (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Singapore : Springer Nature Singapore : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:SpringerBriefs in Applied Sciences and Technology,
Subjects:
Materials > Analysis.
Spectrum analysis.
Microtechnology.
Microelectromechanical systems.
Characterization and Analytical Technique.
Spectroscopy.
Microsystems and MEMS.
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