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Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...
Main Authors: | Brodusch, Nicolas (Author), Demers, Hendrix (Author), Gauvin, Raynald (Author) |
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Corporate Author: | SpringerLink (Online service) |
Format: | e-Book |
Language: | English |
Published: |
Singapore :
Springer Nature Singapore : Imprint: Springer,
2018.
|
Edition: | 1st ed. 2018. |
Series: | SpringerBriefs in Applied Sciences and Technology,
|
Subjects: | |
Online Access: | Full-text access View in OPAC |
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