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Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization /

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron mi...

Detaylı Bibliyografya
Asıl Yazarlar:	Brodusch, Nicolas (Yazar), Demers, Hendrix (Yazar), Gauvin, Raynald (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	e-Kitap
Dil:	İngilizce
Baskı/Yayın Bilgisi:	Singapore : Springer Nature Singapore : 2018. Imprint: Springer,
Edisyon:	1st ed. 2018.
Seri Bilgileri:	SpringerBriefs in Applied Sciences and Technology,
Konular:	Materials > Analysis. Spectrum analysis. Microtechnology. Microelectromechanical systems. Characterization and Analytical Technique. Spectroscopy. Microsystems and MEMS.
Online Erişim:	Full-text access

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