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Multi-run Memory Tests for Pattern Sensitive Faults
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...
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| Format: | e-Book |
| Language: | English |
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Cham :
Springer International Publishing : Imprint: Springer,
2019.
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| Edition: | 1st ed. 2019. |
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| Online Access: | Full-text access View in OPAC |
Internet
Full-text accessView in OPAC
Merkez Kütüphane
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