Loading…
Multi-run Memory Tests for Pattern Sensitive Faults
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...
Main Author: | |
---|---|
Corporate Author: | |
Format: | e-Book |
Language: | English |
Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2019.
|
Edition: | 1st ed. 2019. |
Subjects: | |
Online Access: | Full-text access View in OPAC |
Internet
Full-text accessView in OPAC
Merkez Kütüphane
Copy | UnknownBarcode |
---|