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Multi-run Memory Tests for Pattern Sensitive Faults
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...
Yazar: | Mrozek, Ireneusz (Yazar) |
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Müşterek Yazar: | SpringerLink (Online service) |
Materyal Türü: | e-Kitap |
Dil: | İngilizce |
Baskı/Yayın Bilgisi: |
Cham :
Springer International Publishing :
2019.
Imprint: Springer, |
Edisyon: | 1st ed. 2019. |
Konular: | |
Online Erişim: | Full-text access |
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