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Multi-run Memory Tests for Pattern Sensitive Faults
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...
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| Format: | e-Book |
| Language: | English |
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Cham :
Springer International Publishing : Imprint: Springer,
2019.
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| Edition: | 1st ed. 2019. |
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| Online Access: | Full-text access View in OPAC |
Table of Contents:
- Introduction to digital memory
- Basics of functional RAM testing
- Multi-cell faults
- Controlled random testing
- Multi-run tests based on background changing
- Multi-run tests based on address changing
- Multiple controlled random testing
- Pseudo exhaustive testing based on march tests
- Conclusion.