Multi-run Memory Tests for Pattern Sensitive Faults

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...

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Detaylı Bibliyografya
Yazar: Mrozek, Ireneusz (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Cham : Springer International Publishing : 2019.
Imprint: Springer,
Edisyon:1st ed. 2019.
Konular:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronics.
Electronic Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Erişim:Full-text access
İçindekiler:
  • Introduction to digital memory
  • Basics of functional RAM testing
  • Multi-cell faults
  • Controlled random testing
  • Multi-run tests based on background changing
  • Multi-run tests based on address changing
  • Multiple controlled random testing
  • Pseudo exhaustive testing based on march tests
  • Conclusion.

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