Multi-run Memory Tests for Pattern Sensitive Faults

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...

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Bibliographic Details
Main Author: Mrozek, Ireneusz (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:1st ed. 2019.
Subjects:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronics.
Electronic Circuits and Systems.
Processor Architectures.
Electronics and Microelectronics, Instrumentation.
Online Access:Full-text access
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Table of Contents:
  • Introduction to digital memory
  • Basics of functional RAM testing
  • Multi-cell faults
  • Controlled random testing
  • Multi-run tests based on background changing
  • Multi-run tests based on address changing
  • Multiple controlled random testing
  • Pseudo exhaustive testing based on march tests
  • Conclusion.

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