Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Carter, C. Barry (Editor), Williams, David B. (Editor)
Format: e-Book
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edition:1st ed. 2016.
Subjects:
Materials > Analysis.
Nanoscience.
Spectrum analysis.
Condensed matter.
Mechanics, Applied.
Solids.
Characterization and Analytical Technique.
Nanophysics.
Spectroscopy.
Condensed Matter Physics.
Solid Mechanics.
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