APA (7. basım) Alıntı

Zuo, J. M., & Spence, J. C. (2017). Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience (1st ed. 2017.). Springer New York. https://doi.org/10.1007/978-1-4939-6607-3

Chicago Style (17. basım) Atıf

Zuo, Jian Min, ve John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. 1st ed. 2017. New York, NY: Springer New York, 2017. https://doi.org/10.1007/978-1-4939-6607-3.

MLA (9th ed.) Atıf

Zuo, Jian Min, ve John C.H Spence. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience. 1st ed. 2017. Springer New York, 2017. https://doi.org/10.1007/978-1-4939-6607-3.