Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience /

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

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Bibliographic Details
Main Authors: Zuo, Jian Min (Author), Spence, John C.H (Author)
Corporate Author: SpringerLink (Online service)
Format: e-Book
Language:English
Published: New York, NY : Springer New York : 2017.
Imprint: Springer,
Edition:1st ed. 2017.
Subjects:
Materials > Analysis.
Lasers.
Nanochemistry.
Nanoscience.
Nanotechnology.
Condensed matter.
Characterization and Analytical Technique.
Laser.
Nanophysics.
Condensed Matter Physics.
Online Access:Full-text access
Description
Summary:This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.
Physical Description:XXVI, 729 p. 310 illus., 218 illus. in color. online resource.
ISBN:9781493966073
DOI:10.1007/978-1-4939-6607-3

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