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Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience /
This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...
Main Authors: | Zuo, Jian Min (Author), Spence, John C.H (Author) |
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Corporate Author: | SpringerLink (Online service) |
Format: | e-Book |
Language: | English |
Published: |
New York, NY :
Springer New York :
2017.
Imprint: Springer, |
Edition: | 1st ed. 2017. |
Subjects: | |
Online Access: | Full-text access |
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