APA (7th ed.) Citation

Egerton, R. (2016). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (2nd ed. 2016.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-39877-8

Chicago Style (17th ed.) Citation

Egerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Cham: Springer International Publishing : Imprint: Springer, 2016. https://doi.org/10.1007/978-3-319-39877-8.

MLA (9th ed.) Citation

Egerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Springer International Publishing : Imprint: Springer, 2016. https://doi.org/10.1007/978-3-319-39877-8.