Egerton, R. (2016). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (2nd ed. 2016.). Springer International Publishing. https://doi.org/10.1007/978-3-319-39877-8
Chicago Style (17. basım) AtıfEgerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Cham: Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-39877-8.
MLA (9th ed.) AtıfEgerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-39877-8.
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