APA (7. basım) Alıntı

Egerton, R. (2016). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (2nd ed. 2016.). Springer International Publishing. https://doi.org/10.1007/978-3-319-39877-8

Chicago Style (17. basım) Atıf

Egerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Cham: Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-39877-8.

MLA (9th ed.) Atıf

Egerton, R.F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. 2nd ed. 2016. Springer International Publishing, 2016. https://doi.org/10.1007/978-3-319-39877-8.