Yüklüyor…
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a ne...
Yazar: | Egerton, R.F (Yazar) |
---|---|
Müşterek Yazar: | SpringerLink (Online service) |
Materyal Türü: | e-Kitap |
Dil: | İngilizce |
Baskı/Yayın Bilgisi: |
Cham :
Springer International Publishing :
2016.
Imprint: Springer, |
Edisyon: | 2nd ed. 2016. |
Konular: | |
Online Erişim: | Full-text access |
Benzer Materyaller
-
Springer Handbook of Microscopy
Baskı/Yayın Bilgisi: (Springer International Publishing : Imprint: Springer, 2019.) -
A Beginners' Guide to Scanning Electron Microscopy
Yazar:: Ul-Hamid, Anwar
Baskı/Yayın Bilgisi: (Springer International Publishing : Imprint: Springer, 2018.) -
Scanning Electron Microscopy and X-Ray Microanalysis
Yazar:: Goldstein, Joseph I., ve diğerleri
Baskı/Yayın Bilgisi: (Springer New York : Imprint: Springer, 2018.) -
Controlled Atmosphere Transmission Electron Microscopy Principles and Practice /
Baskı/Yayın Bilgisi: (Springer International Publishing : Imprint: Springer, 2016.) -
Atomic Force Microscopy
Yazar:: Voigtländer, Bert
Baskı/Yayın Bilgisi: (Springer International Publishing : Imprint: Springer, 2019.)