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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

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This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a ne...

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Bibliographic Details
Main Author:	Egerton, R.F (Author)
Corporate Author:	SpringerLink (Online service)
Format:	e-Book
Language:	English
Published:	Cham : Springer International Publishing : 2016. Imprint: Springer,
Edition:	2nd ed. 2016.
Subjects:	Materials > Analysis. Spectrum analysis. Biophysics. Nanotechnology. Characterization and Analytical Technique. Spectroscopy. Bioanalysis and Bioimaging.
Online Access:	Full-text access

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