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Knowledge-Driven Board-Level Functional Fault Diagnosis

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to...

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Bibliographic Details
Main Authors:	Ye, Fangming (Author), Zhang, Zhaobo (Author), Chakrabarty, Krishnendu (Author), Gu, Xinli (Author)
Corporate Author:	SpringerLink (Online service)
Format:	e-Book
Language:	English
Published:	Cham : Springer International Publishing : 2017. Imprint: Springer,
Edition:	1st ed. 2017.
Subjects:	Electronic circuits. Data mining. Electronics. Electronic Circuits and Systems. Data Mining and Knowledge Discovery. Electronics and Microelectronics, Instrumentation.
Online Access:	Full-text access

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