APA (7th ed.) Citation

SpringerLink (Online service) & Mahapatra, S. (2016). Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (1st ed. 2016.). Springer India. https://doi.org/10.1007/978-81-322-2508-9

Chicago Style (17th ed.) Citation

SpringerLink (Online service) and Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2016. New Delhi: Springer India, 2016. https://doi.org/10.1007/978-81-322-2508-9.

MLA (9th ed.) Citation

SpringerLink (Online service) and Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2016. Springer India, 2016. https://doi.org/10.1007/978-81-322-2508-9.