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Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling /
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based mode...
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| Format: | e-Book |
| Language: | English |
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New Delhi :
Springer India : Imprint: Springer,
2016.
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| Edition: | 1st ed. 2016. |
| Series: | Springer Series in Advanced Microelectronics,
52 |
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| Online Access: | Full-text access View in OPAC |