CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...

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Detaylı Bibliyografya
Yazar: Yuan, Jiann-Shiun (Yazar)
Müşterek Yazar: SpringerLink (Online service)
Materyal Türü: e-Kitap
Dil:İngilizce
Baskı/Yayın Bilgisi: Singapore : Springer Nature Singapore : Imprint: Springer, 2016.
Edisyon:1st ed. 2016.
Seri Bilgileri:SpringerBriefs in Reliability,
Konular:
Electronic circuits.
Telecommunication.
Electronic Circuits and Systems.
Microwaves, RF Engineering and Optical Communications.
Online Erişim:Full-text access
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