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Electron microscopy and analysis /

Bibliographic Details
Main Author: Goodhew, Peter J.
Other Authors: Humphreys, F. J., Beanland, R.
Format: Book
Language:English
Published: London : Taylor & Francis, 2001.
Edition:3. baskı
Subjects:
Description
Item Description:dizin : [243]-251 s.
Physical Description:251 sayfa: resim ; 24 cm.
ISBN:9780748409686