Arama Sonuçları - "Atomic-force microscopy"

Atomic Force Microscopy Yazar: Voigtländer, Bert

İçindekiler: “…Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.…”
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Electrical Atomic Force Microscopy for Nanoelectronics

İçindekiler: “…Knoll) -- Characterizing Ferroelectricity with an Atomic Force Microscopy: an all-around technique (S. Martin, B. …”
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Compendium of Surface and Interface Analysis

İçindekiler: “…Acoustic Microscopy -- Action Spectroscopy with STM -- Ambient Pressure X-ray Photoelectron Spectroscopy -- Angle-resolved Ultraviolet Photoelectron Spectroscopy -- Atom Probe Field Ion Microscope -- Atomic Force Microscope -- Auger electron spectroscopy -- Cathodoluminescence -- Conductive Atomic Force Microscopy -- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy -- Dynamic Secondary Ion Mass Spectrometry -- Elastic Recoil Detection Analysis -- Electrochemical Atomic Force Microscopy -- Electrochemical Infrared Spectroscopy -- Electrochemical Scanning Tunneling Microscopy -- Electrochemical Second Harmonic Generation -- Electrochemical Sum Frequency Generation -- Electrochemical Surface X-ray Scattering -- Electrochemical Transmission Electron Microscopy -- Electrochemical X-ray Absorption Fine Structure -- Electrochemical X-ray Photoelectron Spectroscopy -- Electron Backscatter Diffraction -- Electron Energy Loss Spectroscopy -- Electron Probe Microanalysis -- Electron Stimulated Desorption -- Electron-beam-induced current -- Ellipsometry -- Environmental SEM (Atmospheric SEM) -- Environmental Transmission Electron Microscopy -- Extended X-ray Absorption Fine Structure -- Focused Ion Beam Scanning Electron Microscope -- Force Curve -- Force Spectroscopy -- Frequency-Modulation Atomic Force Microscopy -- Gap Mode Raman Spectroscopy -- Glow Discharge Mass Spectrometry -- Glow Discharge Optical Emission Spectrometry -- Hard X-ray Photoelectron Spectroscopy -- Helium Atom Scattering -- High-resolution Elastic Recoil Detection Analysis -- High-resolution electron energy loss spectroscopy -- High-resolution Rutherford Backscattering Spectrometry -- High-Speed Atomic Force Microscopy -- Imaging Ellipsometry -- Impact Collision Ion Scattering Spectroscopy -- Inelastic Electron Tunneling Spectroscopy -- Infrared External-Reflection Spectroscopy -- Infrared Reflection Absorption Spectroscopy -- Interferometer displacement measurement -- Inverse Photoemission Spectroscopy -- Kelvin Probe Force Microscope -- Laser Ionization Secondary Neutral Mass Spectrometry -- Laser Photoelectron Spectroscopy -- Lateral Force Microscopy -- Liquid SPM/AFM -- Low Energy Ion Scattering Spectroscopy -- Low-Energy Electron Diffraction -- Low-Energy Electron Microscope -- Magnetic Force Microscopy -- Matrix-Assisted Laser Desorption/Ionization -- Medium Energy Ion Scattering -- Micro Raman Spectroscopy -- Microprobe Reflection High Energy Electron Diffraction -- Multiple-probe Scanning Probe Microscope -- Nanoscale Angle-resolved Photoelectron Spectroscopy -- Nonlinear Spectroscopy -- Nuclear Reaction Analysis -- Optical Microscopy -- Optical second harmonic generation spectroscopy and microscopy -- Particle Induced X-ray Emission -- Penning Ionization Electron Spectroscopy -- Phase Mode SPM/AFM -- Photoelectron diffraction -- Photoelectron holography -- Photoelectron Yield Spectroscopy -- Photoemission Electron Microscope -- Photoluminescence -- Photon Emission from the Scanning Tunneling Microscope -- Photo-StimulatedDesorption -- Piezoresponse Force Microscope -- Positron-Annihilation-Induced Desorption -- p-Polarized Multiple-Angle Incidence Resolution Spectrometry -- Quartz Crystal Microbalance -- Reflectance Difference Spectroscopy -- Reflection High-Energy Electron Diffraction -- Resonant Inelastic X-ray Scattering -- Rutherford Backscattering Spectrometry -- Scanning Capacitance Microscopy -- Scanning Electrochemical Microscopy -- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry -- Scanning Electron Microscopy -- Scanning Helium Ion Microscope -- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy -- Scanning Probe Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Transmission X-ray Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy -- Soft X-ray Absorption Fine Structure -- Spectroscopic Ellipsometry -- Spin- and Angle-resolved Photoelectron Spectroscopy -- Spin-Polarized Scanning Electron Microscopy -- Spin-Polarized ScanningTunneling Microscopy -- Spin-resolved Photoemission Electron Microscopy -- Super-resolution Microscopy -- Surface acoustic wave -- Surface Enhanced Raman Scattering -- Surface Magneto-optic Kerr Effect -- Surface Plasmon Resonance -- Surface Profilometer -- Surface Sensitive Scanning Electron Microscopy -- Surface X-ray Diffraction -- Surface-enhanced Infrared Absorption Spectroscopy -- Synchrotron Radiation Photoelectron Spectroscopy -- Synchrotron Scanning Tunneling Microscope -- Thermal desorption spectroscopy -- Time-of-Flight Secondary Ion Mass Spectrometry -- Time-resolved Photoelectron Spectroscopy -- Time-resolved Photoemission Electron Microscopy -- Time-resolved Scanning Tunneling Microscopy -- Tip-Enhanced Raman Scattering -- Total Reflection X-Ray Fluorescence -- Transmission Electron Diffraction -- Transmission Electron Microscope -- Ultraviolet Photoelectron Spectroscopy -- Ultraviolet-visible spectrophotometry -- Vibrational Sum Frequency Generation Spectroscopy -- X-ray Absorption Near Edge Structure -- X-ray aided noncontact atomic force microscopy -- X-ray Crystal Truncation Rod Scattering -- X-ray Magnetic Circular Dichroism -- X-ray Photoelectron Spectroscopy -- X-Ray Reflectivity -- X-ray Standing Wave Method.…”
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Micro and Nanomanufacturing Volume II

İçindekiler: “….- Development of a nanopaint for polymeric auto components.- Atomic Force Microscopy for Microbial Cell Surfaces.- Silicon Micro/Nanomachining and Applications.- Solid-State Micropores for Living Cell Detection and Discrimination -- Iron Pyrite (FeS2): Sustainable Photovoltaic Material.- Application of Nanomaterials in Dentistry.- Electrical Conductivity of CVD diamond Thin Films.- Synthesis and Characterisation of Magnetic Nanoparticles in Medicine.- A review on the application of nanofluids in coiled tube heat exchangers.- 3D Printing of pharmaceuticals.- Manufacturing, Numerical and Analytical Model limitations in developing fractal microchannel heat sinks for cooling MEMS, microelectronics and aerospace components --  Microvascular coaptation methods: device manufacture and computational simulation.…”
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Mechanical Properties of Polymers Measured through AFM Force-Distance Curves Yazar: Cappella, Brunero

İçindekiler: “…Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy -- Force-Distance Curves in Practice -- Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films -- Thin Polymer Films -- Polymer Blends -- Creep Compliance Measurement and Force-Modulation.…”
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Handbook of Mechanics of Materials

İçindekiler: “…Dislocation nucleation mediated plasticity of FCC nanowires -- Indentation behaviour of metallic glass via molecular dynamics simulation -- Surface/Interface Stress and Thin Film Stress -- On the vibratory probing of atomic force microscopy -- Characterization of mechanical properties in polymeric materials: A bottom-up approach -- Fracture nanomechanics -- In situ Transmission Electron Microscopy Investigation of Dislocation Interactions -- Multiscale Modeling of Radiation Hardening -- Atomistic simulations of Metal/Al2O3 interfaces -- Multiscale simulation of precipitation in copper-alloyed pipeline steels and in Cu-Ni-Si alloys -- Atomistic simulations of hydrogen effects on lattice defects in alpha iron -- Molecular Dynamics Simulations of Nanopolycrystals.…”
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Handbook of mechanical nanostructuring /

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Membrane Biophysics New Insights and Methods /

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Nanotribology and Nanomechanics An Introduction /

İçindekiler: “…Scanning Probe Microscopy: Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- Calibration of Normal and Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force Microscope -- Part II. …”
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Carbon-related Materials in Recognition of Nobel Lectures by Prof. Akira Suzuki in ICCE

İçindekiler: “…Part I: GRAPHENE AND NANOCARBON MATERIALS -- Chapter1: The Synthesis and the Catalytic Properties of Graphene-based Composite Materials -- Chapter2: Optical characterization of graphene and its derivatives - an experimentalist's perspective -- Chapter3: Submerged liquid plasma for the formation of nanostructured carbon -- Chapter4: Lab on a Graphene -Functionalized Graphene Transistor and Its Application for Biochemical Assay -- Chapter5: Production of single- and few-layer graphene from graphite -- Chapter6: Graphene-based coatings for dental implant surface modification -- Part II: CARBON COMPOSITES AND THIN FILMS -- Chapter7: Effect of CNT on the Mechanical Properties of Composite Materials and Structures -- Chapter8: Energy absorption capability of hybrid fibers reinforced composite tubes -- Chapter9: Graphene Rubber Nanocomposites: Preparation, Structure and Properties -- Chapter10: Effects of Graphene and Graphite on Properties of Highly Filled Polybenzoxazine Bipolar Plate for Proton Exchange Membrane Fuel Cell: A Comparative Study -- Chapter11: Electrical Properties of Amorphous Carbon Nitride Thin Films for Pressure Sensor applications -- Part III: ORGANIC SYNTHESIS AND PHYSICAL CHEMISTRY -- Chapter12: Combination of cross-coupling and metal carbene transformations for the development of new multicomponent reactions -- Chapter13: Synthetic molecular springs: Stretched and contracted helices with their interconversions of mono-substituted polyacetylenes prepared with a rhodium complex catalyst -- Chapter14: The Spin Coupling in the Polyaromatic Hydrocarbons and Carbon-based Materials -- Chapter15: Electrocatalytic Hydrogen Production Properties of Polyaniline doped with Metal Organic Frameworks -- Chapter16: Plasma Bonding of Plastic Films -- Part IV: CHARACTERIZATION TOOL -- Chapter17: Atomic Force Microscopy for Characterizing Nanocomposites.…”
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Springer Handbook of Microscopy

İçindekiler: “….: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary & Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences.…”
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Progress in adhesion and adhesives /

İçindekiler: “…5.1 Introduction5.1.1 Wood Material Properties Relevant to Adhesion; 5.1.2 Objectives; 5.2 Mechanical Interlocking and Mechanics of Adhesive-Wood Interactions; 5.2.1 Atomic Force Microscopy (AFM) & Nanoindentation; 5.3 Electrostatic Adhesion; 5.4 Wettability, Surface Energy, Thermodynamic Adhesion; 5.4.1 Wood Anatomy Impact on Wetting; 5.4.2 Extractives; 5.4.3 Adhesive Wettability; 5.4.4 Wood Modification; 5.4.4.1 Acetylation; 5.4.4.2 Grafting; 5.4.4.3 Fire Retardants, Preservatives and Adhesion Promotion; 5.4.5 Test Methods; 5.5 Diffusion Theory of Adhesion; 5.6 Covalent Bonding…”
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Mixing of Rubber Compounds. Yazar: Limper, Andreas

İçindekiler: “…5.12 Factors Influencing the Mixing Process -- 5.12.1 Influence of Plasticizer Addition on the Mixing Process and Compound Properties -- 5.12.2 Influences of the Mixing Process on the Injection Molding Process -- 5.12.3 Influence of the Mixing Process on Extrusion -- 5.12.4 Influence of the Milling Process on Compound and Part Properties -- The Purpose of Roll Mills within the Mixing Process -- The Batch-Off -- 5.13 Summary -- References for Section 5.8 to 5.13 -- 6 Dispersion and Distribution of Fillers -- 6.1 Dispersive and Distributive Mixing -- 6.1.1 Dispersive Mixing -- 6.1.2 Distributive Mixing -- 6.1.3 Quality or "Goodness" of Mixes -- 6.2 Mechanism of Filler Dispersion -- 6.2.1 Theoretical Approach -- 6.2.2 Phases of Mixing Process -- 6.2.3 Polymer-Filler versus Filler-Filler Interactions -- 6.3 Dispersion Measurements -- 6.3.1 Macro-Dispersion -- 6.3.1.1 Optical Transmission Microscopy -- 6.3.1.2 Optical Roughness Measurements -- 6.3.1.3 Mechanical Scanning Microscopy -- 6.3.1.4 Reflectometry -- 6.3.2 Micro-Dispersion -- 6.3.2.1 Electrical Measurements -- 6.3.2.2 Transmission Electron Microscopy -- 6.3.2.3 Atomic Force Microscopy -- 6.4 Control of Dispersion by Pro­cess ­Para­meters -- 6.4.1 Mixing Procedures -- 6.4.2 Temperature, Torque, and Power Consumption -- 6.4.3 Mixing Time and Rotor Speed -- 6.4.4 Cooling -- 6.4.5 Alternative Dispersion Techniques -- 6.5 Materials Influences on Filler Dispersion -- 6.5.1 Influence of the Polymer -- 6.5.1.1 Adsorption from Solution and Melt -- 6.5.1.2 Influence of the Polymer on Filler Dispersion -- 6.5.2 Influence of the Filler Morphology and Surface Properties -- 6.5.2.1 Influence of Surface Specific Area -- 6.5.2.2 Influence of Structure -- 6.5.2.3 Influence of Filler Surface Activity -- 6.5.2.4 Dispersion Kinetics -- 6.5.2.5 Filler Re-Agglomeration -- 6.5.3 Influence of Oil on Filler Dispersion.…”
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On-Surface Synthesis Proceedings of the International Workshop On-Surface Synthesis, École des Houches, Les Houches 25-30 May 2014 /

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