Search Results - (("transmission selection microscopy.") OR ("transmission electronic microscopy."))*

Transmission electron microscopy : a textbook for materials science / by Williams, David B, 1949- (David Bernard)

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Transmission electron microscopy : physics of image formation / by Reimer, Ludwig

Subjects: “…Transmission electron microscopy. 61308…”

Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

Table of Contents: “…Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. …”
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Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience / by Zuo, Jian Min, Spence, John C.H

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Controlled Atmosphere Transmission Electron Microscopy Principles and Practice /

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Measurement Techniques and Practices of Colloid and Interface Phenomena

Table of Contents: “…Freeze-Fracture Transmission Electron Microscopy -- 14. Cryo-Transmission Electron Microscopy -- 15. …”
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Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and STEM / by Tanaka, Nobuo

Table of Contents: “…Seeing nanometer-sized world -- Structure and imaging of a transmission electron microscope (TEM) -- Basic theories of TEM imaging -- Resolution and image contrast of a transmission electron microscope (TEM) -- What is high-resolution transmission electron microscopy ? -- Lattice images and structure images -- Imaging theory of high-resolution TEM and image simulation -- Advanced transmission electron microscopy -- What is scanning transmission electron microscopy (STEM)? …”
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Springer Handbook of Microscopy

Table of Contents: “….: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.…”
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Handbook of Mechanics of Materials

Table of Contents: “…Dislocation nucleation mediated plasticity of FCC nanowires -- Indentation behaviour of metallic glass via molecular dynamics simulation -- Surface/Interface Stress and Thin Film Stress -- On the vibratory probing of atomic force microscopy -- Characterization of mechanical properties in polymeric materials: A bottom-up approach -- Fracture nanomechanics -- In situ Transmission Electron Microscopy Investigation of Dislocation Interactions -- Multiscale Modeling of Radiation Hardening -- Atomistic simulations of Metal/Al2O3 interfaces -- Multiscale simulation of precipitation in copper-alloyed pipeline steels and in Cu-Ni-Si alloys -- Atomistic simulations of hydrogen effects on lattice defects in alpha iron -- Molecular Dynamics Simulations of Nanopolycrystals.…”
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Molecular Soft-Interface Science Principles, Molecular Design, Characterization and Application /

Table of Contents: “…Scanning Electron Microscopy -- 10. Transmission Electron Microscopy -- 11. Scanning Probe Microscopy (SPM) -- 12. …”
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Compendium of Surface and Interface Analysis

Table of Contents: “…Acoustic Microscopy -- Action Spectroscopy with STM -- Ambient Pressure X-ray Photoelectron Spectroscopy -- Angle-resolved Ultraviolet Photoelectron Spectroscopy -- Atom Probe Field Ion Microscope -- Atomic Force Microscope -- Auger electron spectroscopy -- Cathodoluminescence -- Conductive Atomic Force Microscopy -- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy -- Dynamic Secondary Ion Mass Spectrometry -- Elastic Recoil Detection Analysis -- Electrochemical Atomic Force Microscopy -- Electrochemical Infrared Spectroscopy -- Electrochemical Scanning Tunneling Microscopy -- Electrochemical Second Harmonic Generation -- Electrochemical Sum Frequency Generation -- Electrochemical Surface X-ray Scattering -- Electrochemical Transmission Electron Microscopy -- Electrochemical X-ray Absorption Fine Structure -- Electrochemical X-ray Photoelectron Spectroscopy -- Electron Backscatter Diffraction -- Electron Energy Loss Spectroscopy -- Electron Probe Microanalysis -- Electron Stimulated Desorption -- Electron-beam-induced current -- Ellipsometry -- Environmental SEM (Atmospheric SEM) -- Environmental Transmission Electron Microscopy -- Extended X-ray Absorption Fine Structure -- Focused Ion Beam Scanning Electron Microscope -- Force Curve -- Force Spectroscopy -- Frequency-Modulation Atomic Force Microscopy -- Gap Mode Raman Spectroscopy -- Glow Discharge Mass Spectrometry -- Glow Discharge Optical Emission Spectrometry -- Hard X-ray Photoelectron Spectroscopy -- Helium Atom Scattering -- High-resolution Elastic Recoil Detection Analysis -- High-resolution electron energy loss spectroscopy -- High-resolution Rutherford Backscattering Spectrometry -- High-Speed Atomic Force Microscopy -- Imaging Ellipsometry -- Impact Collision Ion Scattering Spectroscopy -- Inelastic Electron Tunneling Spectroscopy -- Infrared External-Reflection Spectroscopy -- Infrared Reflection Absorption Spectroscopy -- Interferometer displacement measurement -- Inverse Photoemission Spectroscopy -- Kelvin Probe Force Microscope -- Laser Ionization Secondary Neutral Mass Spectrometry -- Laser Photoelectron Spectroscopy -- Lateral Force Microscopy -- Liquid SPM/AFM -- Low Energy Ion Scattering Spectroscopy -- Low-Energy Electron Diffraction -- Low-Energy Electron Microscope -- Magnetic Force Microscopy -- Matrix-Assisted Laser Desorption/Ionization -- Medium Energy Ion Scattering -- Micro Raman Spectroscopy -- Microprobe Reflection High Energy Electron Diffraction -- Multiple-probe Scanning Probe Microscope -- Nanoscale Angle-resolved Photoelectron Spectroscopy -- Nonlinear Spectroscopy -- Nuclear Reaction Analysis -- Optical Microscopy -- Optical second harmonic generation spectroscopy and microscopy -- Particle Induced X-ray Emission -- Penning Ionization Electron Spectroscopy -- Phase Mode SPM/AFM -- Photoelectron diffraction -- Photoelectron holography -- Photoelectron Yield Spectroscopy -- Photoemission Electron Microscope -- Photoluminescence -- Photon Emission from the Scanning Tunneling Microscope -- Photo-StimulatedDesorption -- Piezoresponse Force Microscope -- Positron-Annihilation-Induced Desorption -- p-Polarized Multiple-Angle Incidence Resolution Spectrometry -- Quartz Crystal Microbalance -- Reflectance Difference Spectroscopy -- Reflection High-Energy Electron Diffraction -- Resonant Inelastic X-ray Scattering -- Rutherford Backscattering Spectrometry -- Scanning Capacitance Microscopy -- Scanning Electrochemical Microscopy -- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry -- Scanning Electron Microscopy -- Scanning Helium Ion Microscope -- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy -- Scanning Probe Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Transmission X-ray Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy -- Soft X-ray Absorption Fine Structure -- Spectroscopic Ellipsometry -- Spin- and Angle-resolved Photoelectron Spectroscopy -- Spin-Polarized Scanning Electron Microscopy -- Spin-Polarized ScanningTunneling Microscopy -- Spin-resolved Photoemission Electron Microscopy -- Super-resolution Microscopy -- Surface acoustic wave -- Surface Enhanced Raman Scattering -- Surface Magneto-optic Kerr Effect -- Surface Plasmon Resonance -- Surface Profilometer -- Surface Sensitive Scanning Electron Microscopy -- Surface X-ray Diffraction -- Surface-enhanced Infrared Absorption Spectroscopy -- Synchrotron Radiation Photoelectron Spectroscopy -- Synchrotron Scanning Tunneling Microscope -- Thermal desorption spectroscopy -- Time-of-Flight Secondary Ion Mass Spectrometry -- Time-resolved Photoelectron Spectroscopy -- Time-resolved Photoemission Electron Microscopy -- Time-resolved Scanning Tunneling Microscopy -- Tip-Enhanced Raman Scattering -- Total Reflection X-Ray Fluorescence -- Transmission Electron Diffraction -- Transmission Electron Microscope -- Ultraviolet Photoelectron Spectroscopy -- Ultraviolet-visible spectrophotometry -- Vibrational Sum Frequency Generation Spectroscopy -- X-ray Absorption Near Edge Structure -- X-ray aided noncontact atomic force microscopy -- X-ray Crystal Truncation Rod Scattering -- X-ray Magnetic Circular Dichroism -- X-ray Photoelectron Spectroscopy -- X-Ray Reflectivity -- X-ray Standing Wave Method.…”
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Proceedings of the 18th International Conference on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors

Table of Contents: “…Irradiation Damage - Nickel Based and Low Alloy -- High Resolution Transmission Electron Microscopy of Irradiation Damage in Inconel X-750 -- In-situ SEM Push-to-pull Micro-tensile Testing of in Service Inconel X-750 Annulus Spacers -- Microstructural Characterization of Proton-irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography -- Part 9. …”
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Mixing of Rubber Compounds. by Limper, Andreas

Table of Contents: “…5.12 Factors Influencing the Mixing Process -- 5.12.1 Influence of Plasticizer Addition on the Mixing Process and Compound Properties -- 5.12.2 Influences of the Mixing Process on the Injection Molding Process -- 5.12.3 Influence of the Mixing Process on Extrusion -- 5.12.4 Influence of the Milling Process on Compound and Part Properties -- The Purpose of Roll Mills within the Mixing Process -- The Batch-Off -- 5.13 Summary -- References for Section 5.8 to 5.13 -- 6 Dispersion and Distribution of Fillers -- 6.1 Dispersive and Distributive Mixing -- 6.1.1 Dispersive Mixing -- 6.1.2 Distributive Mixing -- 6.1.3 Quality or "Goodness" of Mixes -- 6.2 Mechanism of Filler Dispersion -- 6.2.1 Theoretical Approach -- 6.2.2 Phases of Mixing Process -- 6.2.3 Polymer-Filler versus Filler-Filler Interactions -- 6.3 Dispersion Measurements -- 6.3.1 Macro-Dispersion -- 6.3.1.1 Optical Transmission Microscopy -- 6.3.1.2 Optical Roughness Measurements -- 6.3.1.3 Mechanical Scanning Microscopy -- 6.3.1.4 Reflectometry -- 6.3.2 Micro-Dispersion -- 6.3.2.1 Electrical Measurements -- 6.3.2.2 Transmission Electron Microscopy -- 6.3.2.3 Atomic Force Microscopy -- 6.4 Control of Dispersion by Pro­cess ­Para­meters -- 6.4.1 Mixing Procedures -- 6.4.2 Temperature, Torque, and Power Consumption -- 6.4.3 Mixing Time and Rotor Speed -- 6.4.4 Cooling -- 6.4.5 Alternative Dispersion Techniques -- 6.5 Materials Influences on Filler Dispersion -- 6.5.1 Influence of the Polymer -- 6.5.1.1 Adsorption from Solution and Melt -- 6.5.1.2 Influence of the Polymer on Filler Dispersion -- 6.5.2 Influence of the Filler Morphology and Surface Properties -- 6.5.2.1 Influence of Surface Specific Area -- 6.5.2.2 Influence of Structure -- 6.5.2.3 Influence of Filler Surface Activity -- 6.5.2.4 Dispersion Kinetics -- 6.5.2.5 Filler Re-Agglomeration -- 6.5.3 Influence of Oil on Filler Dispersion.…”
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Metal Matrix Composites Wetting and Infiltration / by Contreras Cuevas, Antonio, Bedolla Becerril, Egberto, Martínez, Melchor Salazar, Lemus Ruiz, José

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Characterization of Metals and Alloys

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