Arama Sonuçları - (scanning OR planning) electronic microscopes.

Scanning electron microscopy and x-ray microanalysis / Yazar: Goldstein, Joseph

Konular:

Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization / Yazar: Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald

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Scanning Electron Microscopy and X-Ray Microanalysis Yazar: Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.

İçindekiler: “…Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- CompositionalMapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.…”
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A Beginners' Guide to Scanning Electron Microscopy Yazar: Ul-Hamid, Anwar

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Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and STEM / Yazar: Tanaka, Nobuo

İçindekiler: “…-- Imaging of scanning transmission electron microscopy (STEM) -- Image contrast and its formation mechanism in STEM -- Imaging theory for STEM -- Future prospects and possibility of TEM and STEM -- Concluding remarks -- Introduction of Fourier transforms for TEM and STEM -- Imaging by using a convex lens: Convex lens as phase shifter -- Contrast transfer function of a transmission electron microscope: Key term for understanding of phase contrast in HRTEM -- Complex-valued expression of aberrations of a round lens -- Cowley's theoryfor TEM and STEM imaging -- Introduction to the imaging theory for TEM including non-linear terms -- What are image processing methods? …”
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Imaging marine life : macrophotography and microscopy approaches for marine biology /

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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM / Yazar: Egerton, R.F

İçindekiler: “…An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.…”
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Contactless VLSI Measurement and Testing Techniques Yazar: Sayil, Selahattin

İçindekiler: “…Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe -- 8. …”
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Nanopositioning Technologies Fundamentals and Applications /

İçindekiler: “…A Review of Nanomanipulation in Scanning Electron Microscopes -- 12. Nanopositioning for lithography and data storage.…”
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Engineering Optics Yazar: Iizuka, Keigo

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Atomic Force Microscopy Yazar: Voigtländer, Bert

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Nanotribology and Nanomechanics An Introduction /

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Compendium of Surface and Interface Analysis

İçindekiler: “…Acoustic Microscopy -- Action Spectroscopy with STM -- Ambient Pressure X-ray Photoelectron Spectroscopy -- Angle-resolved Ultraviolet Photoelectron Spectroscopy -- Atom Probe Field Ion Microscope -- Atomic Force Microscope -- Auger electron spectroscopy -- Cathodoluminescence -- Conductive Atomic Force Microscopy -- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy -- Dynamic Secondary Ion Mass Spectrometry -- Elastic Recoil Detection Analysis -- Electrochemical Atomic Force Microscopy -- Electrochemical Infrared Spectroscopy -- Electrochemical Scanning Tunneling Microscopy -- Electrochemical Second Harmonic Generation -- Electrochemical Sum Frequency Generation -- Electrochemical Surface X-ray Scattering -- Electrochemical Transmission Electron Microscopy -- Electrochemical X-ray Absorption Fine Structure -- Electrochemical X-ray Photoelectron Spectroscopy -- Electron Backscatter Diffraction -- Electron Energy Loss Spectroscopy -- Electron Probe Microanalysis -- Electron Stimulated Desorption -- Electron-beam-induced current -- Ellipsometry -- Environmental SEM (Atmospheric SEM) -- Environmental Transmission Electron Microscopy -- Extended X-ray Absorption Fine Structure -- Focused Ion Beam Scanning Electron Microscope -- Force Curve -- Force Spectroscopy -- Frequency-Modulation Atomic Force Microscopy -- Gap Mode Raman Spectroscopy -- Glow Discharge Mass Spectrometry -- Glow Discharge Optical Emission Spectrometry -- Hard X-ray Photoelectron Spectroscopy -- Helium Atom Scattering -- High-resolution Elastic Recoil Detection Analysis -- High-resolution electron energy loss spectroscopy -- High-resolution Rutherford Backscattering Spectrometry -- High-Speed Atomic Force Microscopy -- Imaging Ellipsometry -- Impact Collision Ion Scattering Spectroscopy -- Inelastic Electron Tunneling Spectroscopy -- Infrared External-Reflection Spectroscopy -- Infrared Reflection Absorption Spectroscopy -- Interferometer displacement measurement -- Inverse Photoemission Spectroscopy -- Kelvin Probe Force Microscope -- Laser Ionization Secondary Neutral Mass Spectrometry -- Laser Photoelectron Spectroscopy -- Lateral Force Microscopy -- Liquid SPM/AFM -- Low Energy Ion Scattering Spectroscopy -- Low-Energy Electron Diffraction -- Low-Energy Electron Microscope -- Magnetic Force Microscopy -- Matrix-Assisted Laser Desorption/Ionization -- Medium Energy Ion Scattering -- Micro Raman Spectroscopy -- Microprobe Reflection High Energy Electron Diffraction -- Multiple-probe Scanning Probe Microscope -- Nanoscale Angle-resolved Photoelectron Spectroscopy -- Nonlinear Spectroscopy -- Nuclear Reaction Analysis -- Optical Microscopy -- Optical second harmonic generation spectroscopy and microscopy -- Particle Induced X-ray Emission -- Penning Ionization Electron Spectroscopy -- Phase Mode SPM/AFM -- Photoelectron diffraction -- Photoelectron holography -- Photoelectron Yield Spectroscopy -- Photoemission Electron Microscope -- Photoluminescence -- Photon Emission from the Scanning Tunneling Microscope -- Photo-StimulatedDesorption -- Piezoresponse Force Microscope -- Positron-Annihilation-Induced Desorption -- p-Polarized Multiple-Angle Incidence Resolution Spectrometry -- Quartz Crystal Microbalance -- Reflectance Difference Spectroscopy -- Reflection High-Energy Electron Diffraction -- Resonant Inelastic X-ray Scattering -- Rutherford Backscattering Spectrometry -- Scanning Capacitance Microscopy -- Scanning Electrochemical Microscopy -- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry -- Scanning Electron Microscopy -- Scanning Helium Ion Microscope -- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy -- Scanning Probe Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Transmission X-ray Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy -- Soft X-ray Absorption Fine Structure -- Spectroscopic Ellipsometry -- Spin- and Angle-resolved Photoelectron Spectroscopy -- Spin-Polarized Scanning Electron Microscopy -- Spin-Polarized ScanningTunneling Microscopy -- Spin-resolved Photoemission Electron Microscopy -- Super-resolution Microscopy -- Surface acoustic wave -- Surface Enhanced Raman Scattering -- Surface Magneto-optic Kerr Effect -- Surface Plasmon Resonance -- Surface Profilometer -- Surface Sensitive Scanning Electron Microscopy -- Surface X-ray Diffraction -- Surface-enhanced Infrared Absorption Spectroscopy -- Synchrotron Radiation Photoelectron Spectroscopy -- Synchrotron Scanning Tunneling Microscope -- Thermal desorption spectroscopy -- Time-of-Flight Secondary Ion Mass Spectrometry -- Time-resolved Photoelectron Spectroscopy -- Time-resolved Photoemission Electron Microscopy -- Time-resolved Scanning Tunneling Microscopy -- Tip-Enhanced Raman Scattering -- Total Reflection X-Ray Fluorescence -- Transmission Electron Diffraction -- Transmission Electron Microscope -- Ultraviolet Photoelectron Spectroscopy -- Ultraviolet-visible spectrophotometry -- Vibrational Sum Frequency Generation Spectroscopy -- X-ray Absorption Near Edge Structure -- X-ray aided noncontact atomic force microscopy -- X-ray Crystal Truncation Rod Scattering -- X-ray Magnetic Circular Dichroism -- X-ray Photoelectron Spectroscopy -- X-Ray Reflectivity -- X-ray Standing Wave Method.…”
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Atomic- and Nanoscale Magnetism

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Handbook of Materials Characterization

İçindekiler: “…Materials Characterization using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications -- Chapter 7.Atomic and magnetic force microscopic studies of Co thin films and nanoparticles: understanding the surface correlation using fractal studies -- Chapter 8.Optical spectroscopy and its applications in inorganic materials -- Chapter 9.Fourier Transform Infrared Spectroscopy: Fundamentals and application in functional groups and nanomaterials characterization -- Chapter 10.Rare Earths Luminescence: Electronic Spectroscopy and Applications -- Chapter 11.Raman Spectroscopy: A Potential Characterization Tool for Carbon Materials -- Chapter 12.Photoelectron Spectroscopy: Fundamental Principles and Applications -- Chapter 13.Introduction to X-Ray Absorption Spectroscopy and its applications in material science -- Chapter 14.31P Solid-state NMR spectroscopy of adsorbed phosphorous probe molecules: Acidity characterization of solid acid carbonaceous materials for catalytic applications.…”
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Springer Handbook of Microscopy

İçindekiler: “…Part A: Electron and Ion Microscopy -- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.…”
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Reactivity of Nitric Oxide on Copper Surfaces Elucidated by Direct Observation of Valence Orbitals / Yazar: Shiotari, Akitoshi

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Automation 2017 Innovations in Automation, Robotics and Measurement Techniques /

İçindekiler: “…Simulation Results of Velocity Fractional-Order PI Controller of a Servo Drive -- An accuracy estimation for a non-integer order, discrete, state space model of heat transfer process -- Dynamic model and simulation of electro-hydraulic proportional valve -- CIE-DataGlove, a Multi-IMU System for Hand Posture Tracking -- Data-driven Video Game Agent Pathfinding -- The Development of PIAP Fenix Mobile Robot -- Calibration of Scanning Electron Microscope with Improved Model of the Silicon Relief Measure -- Gravimeters of Aviation Gravimetric System: Сlassification, Comparative Analysis, Prospects -- Test Stand for Matteucci Effect Measurements -- Utilization of Deep Reinforcement Learning for saccadic-based object visual search -- Review of 3D Objects Segmentation Methods.…”
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The Proceedings of the International Conference on Sensing and Imaging

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On-Surface Atomic Wires and Logic Gates Updated in 2016 Proceedings of the International Workshop on Atomic Wires, Krakow, September 2014 /

İçindekiler: “…Surface Hydrogenation of the Si(100)-2x1 and electronic properties of silicon dangling bonds on the Si(100):H surfaces -- Nanopackaging of Si(100)H wafer for atomic scale investigations -- Atomic wires on Ge(001):H surface -- Si(100):H and Ge(100):H Dimer Rows Contrast Inversion in Low-Temperature Scanning Tunnelling Microscope Images -- Band engineering of dangling-bond wires on the Si (100)H surface -- Band Engineering of the Si(001):H Surface by Doping with P and B Atoms -- Electronic Properties of a Single Dangling Bond and of Dangling Bond Wires on a Si(001)H Surface -- Quantum Hamiltonian Computing (QHC) Logic Gates -- The Design of a surface atomic scale logic gate with molecular latch inputs -- Molecule Latches in atomic scale surface logic gates constructed on the Si(100)H surface -- Complex atomic scale surface electronic circuit's simulator including the pads and the supporting surface.…”
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