Arama Sonuçları - atomic nucleus~

Enrico Fermi, atom çağının öncüsü / Yazar: Gottfried, Ted

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Çok geç olmadan : bir bilimadamı gözüyle nükleer enerji / Yazar: Cohen, Bernard I.

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Atomaltı parçacıklar : bir keşif serüveni / Yazar: Weinberg, Steven

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Çernobil /

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Isaiah Shavitt A Memorial Festschrift from Theoretical Chemistry Accounts /

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Spectroscopy and Optical Diagnostics for Gases Yazar: Hanson, Ronald K., Spearrin, R. Mitchell, Goldenstein, Christopher S.

İçindekiler: “…Introduction -- Diatomic Molecular Spectra -- Bond Dissociation Energies -- Polyatomic Molecular Spectra -- Effects of Nuclear Spin -- Rayleigh & Raman Spectra -- Quantitative Emission and Absorption -- Spectral Lineshapes -- Electronic Spectra of Atoms -- Electronic Spectra of Diatomics -- Laser-Induced Fluorescence -- Diagnostic Techniques -- Spectroscopy Equipment -- Case Studies -- Glossary -- Voigt Tables -- Voigt Fitting Program -- HITRAN Database -- Center of Symmetry -- Fluorescence Yield: Multi-level Models.…”
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Study of the Calcium Regulation Mechanism of TCR Activation Using Nanodisc and NMR Technologies Yazar: Bi, Yunchen

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Quantum Dynamics and Laser Control for Photochemistry Yazar: Sala, Matthieu

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Proceedings of the 18th International Conference on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors

İçindekiler: “…-- Aqueous Degradation in Harvested Medium Voltage Cables in Nuclear Power Plants -- Frequency Domain Reflectometry Modeling and Measurement for Nondestructive Evaluation of Nuclear Power Plant Cables -- Aging Mechanisms and Nondestructive Aging Indicator of Filled Cross-linked Polyethylene (XLPE) Exposed to Simultaneous Thermal and Gamma Radiation -- Successful Detection of Insulation Degradation in Cables by Frequency Domain Reflectometry -- Capacitive Nondestructive Evaluation of Aged Cross-Linked Polyethylene (XLPE) Cable Insulation Material -- C-2: Tracking of Nuclear Cable Insulation Polymer Structural Changes using the Gel Fraction and Uptake Factor Method -- C-4: Degradation of Silicone Rubber Analyzed by Instrumental Analyses and Dielectric Spectroscop.…”
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Fundamentals of Radiation Materials Science Metals and Alloys / Yazar: WAS, GARY S.

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Applications of Radiation Chemistry in the Fields of Industry, Biotechnology and Environment

İçindekiler: “…Preparation Method -- Application of Radiation Chemistry to Some Selected Technological Issues Related to the Development of Nuclear Energy -- Upgrading and Refining of Crude Oils and Petroleum Products by Ionizing Irradiation -- The Use of Gamma Radiation for the Treatment of Cultural Heritage in the Argentine National Atomic Energy Commission: Past, Present, and Future -- Electron Beam Technology and Other Irradiation Technology Applications in the Food Industry -- Applications of Accelerators and Radiation Sources in the Field of Space Research and Industry.<.…”
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Discovering chemistry with natural bond orbitals / Yazar: Weinhold, Frank, 1941-

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Materials Handbook A Concise Desktop Reference / Yazar: Cardarelli, François

İçindekiler: “…Introduction -- Properties of Materials -- Ferrous Metals and Their Alloys -- Common Nonferrous Metals -- Less Common Nonferrous Metals -- Semiconductors -- Superconductors -- Magnetic Materials -- Insulators and Dielectrics -- Miscellaneous Electrical Materials -- Ceramics, Refractories and Glasses -- Polymers and Elastomers -- Minerals, Ores and Gemstones -- Rocks and Meteorites -- Soils and Fertilizers -- Cements, Concrete, Building Stones and Construction Materials -- Timbers and Woods -- Fuels, Propellants and Explosives -- Composite Materials -- Gases -- Liquids -- Food Materials -- Natural Oils, Fats, Resins and Waxes -- Nuclear Materials -- Materials Occupational Health and Safety -- Globally Harmonized System -- Appendices: Background Data for the Chemical Elements; Chart for Semi-Microchemical Qualitative Identification of Metal Cations; NIST Thermochemical Data for Pure Substances; Hydrogen-Like Atom Spectra; Hydrogen-like Atom Spectra; Crystal Field Theory; Transparent Materials for Optical Windows; Corrosion Resistance of Materials Towards Various Corrosive Media; Astonomical Data; Materials Societies -- Bibliography -- Index.…”
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CRC handbook of chemistry and physics : a ready-reference book of chemical and physical data /

İçindekiler: “…Molecular structure and spectroscopy -- 10. Atomic, molecular, and optical physics -- 11. Nuclear and particle physics -- 12. …”
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Food Analysis

İçindekiler: “…Introduction to Food Analysis -- United States Government Regulations and International Standards Related to Food Analysis -- Nutrition Labeling -- Evaluation of Analytical Data Sampling and Sample Preparation -- Basic Principles of Spectroscopy -- Ultraviolet, Visible, and Fluorescence Spectroscopy -- Infrared and Raman Spectroscopy -- Atomic Absorption Spectroscopy, Atomic Emission Spectroscopy, and Inductively Coupled Plasma-Mass Spectrometry -- Nuclear Magnetic Resonance -- Mass Spectrometry -- Basic Principles of Chromatography -- High Performance Liquid Chromatography -- Gas Chromatography -- Moisture and Total Solids Analysis -- Ash Analysis -- Fat Analysis -- Protein Analysis -- Carbohydrate Analysis -- Vitamin Analysis -- Traditional Methods for Mineral Analysis -- pH and Titratable Acidity -- Fat Characterization -- Protein Separation and Characterization Procedures -- Determination of (Total) Phenolics and Antioxidant Capacity in Food and Ingredients -- Application of Enzymes in Food Analysis.…”
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Two-Phase Flow for Automotive and Power Generation Sectors

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Handbook of Mechanics of Materials

İçindekiler: “…Dislocation nucleation mediated plasticity of FCC nanowires -- Indentation behaviour of metallic glass via molecular dynamics simulation -- Surface/Interface Stress and Thin Film Stress -- On the vibratory probing of atomic force microscopy -- Characterization of mechanical properties in polymeric materials: A bottom-up approach -- Fracture nanomechanics -- In situ Transmission Electron Microscopy Investigation of Dislocation Interactions -- Multiscale Modeling of Radiation Hardening -- Atomistic simulations of Metal/Al2O3 interfaces -- Multiscale simulation of precipitation in copper-alloyed pipeline steels and in Cu-Ni-Si alloys -- Atomistic simulations of hydrogen effects on lattice defects in alpha iron -- Molecular Dynamics Simulations of Nanopolycrystals.…”
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Compendium of Surface and Interface Analysis

İçindekiler: “…Acoustic Microscopy -- Action Spectroscopy with STM -- Ambient Pressure X-ray Photoelectron Spectroscopy -- Angle-resolved Ultraviolet Photoelectron Spectroscopy -- Atom Probe Field Ion Microscope -- Atomic Force Microscope -- Auger electron spectroscopy -- Cathodoluminescence -- Conductive Atomic Force Microscopy -- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy -- Dynamic Secondary Ion Mass Spectrometry -- Elastic Recoil Detection Analysis -- Electrochemical Atomic Force Microscopy -- Electrochemical Infrared Spectroscopy -- Electrochemical Scanning Tunneling Microscopy -- Electrochemical Second Harmonic Generation -- Electrochemical Sum Frequency Generation -- Electrochemical Surface X-ray Scattering -- Electrochemical Transmission Electron Microscopy -- Electrochemical X-ray Absorption Fine Structure -- Electrochemical X-ray Photoelectron Spectroscopy -- Electron Backscatter Diffraction -- Electron Energy Loss Spectroscopy -- Electron Probe Microanalysis -- Electron Stimulated Desorption -- Electron-beam-induced current -- Ellipsometry -- Environmental SEM (Atmospheric SEM) -- Environmental Transmission Electron Microscopy -- Extended X-ray Absorption Fine Structure -- Focused Ion Beam Scanning Electron Microscope -- Force Curve -- Force Spectroscopy -- Frequency-Modulation Atomic Force Microscopy -- Gap Mode Raman Spectroscopy -- Glow Discharge Mass Spectrometry -- Glow Discharge Optical Emission Spectrometry -- Hard X-ray Photoelectron Spectroscopy -- Helium Atom Scattering -- High-resolution Elastic Recoil Detection Analysis -- High-resolution electron energy loss spectroscopy -- High-resolution Rutherford Backscattering Spectrometry -- High-Speed Atomic Force Microscopy -- Imaging Ellipsometry -- Impact Collision Ion Scattering Spectroscopy -- Inelastic Electron Tunneling Spectroscopy -- Infrared External-Reflection Spectroscopy -- Infrared Reflection Absorption Spectroscopy -- Interferometer displacement measurement -- Inverse Photoemission Spectroscopy -- Kelvin Probe Force Microscope -- Laser Ionization Secondary Neutral Mass Spectrometry -- Laser Photoelectron Spectroscopy -- Lateral Force Microscopy -- Liquid SPM/AFM -- Low Energy Ion Scattering Spectroscopy -- Low-Energy Electron Diffraction -- Low-Energy Electron Microscope -- Magnetic Force Microscopy -- Matrix-Assisted Laser Desorption/Ionization -- Medium Energy Ion Scattering -- Micro Raman Spectroscopy -- Microprobe Reflection High Energy Electron Diffraction -- Multiple-probe Scanning Probe Microscope -- Nanoscale Angle-resolved Photoelectron Spectroscopy -- Nonlinear Spectroscopy -- Nuclear Reaction Analysis -- Optical Microscopy -- Optical second harmonic generation spectroscopy and microscopy -- Particle Induced X-ray Emission -- Penning Ionization Electron Spectroscopy -- Phase Mode SPM/AFM -- Photoelectron diffraction -- Photoelectron holography -- Photoelectron Yield Spectroscopy -- Photoemission Electron Microscope -- Photoluminescence -- Photon Emission from the Scanning Tunneling Microscope -- Photo-StimulatedDesorption -- Piezoresponse Force Microscope -- Positron-Annihilation-Induced Desorption -- p-Polarized Multiple-Angle Incidence Resolution Spectrometry -- Quartz Crystal Microbalance -- Reflectance Difference Spectroscopy -- Reflection High-Energy Electron Diffraction -- Resonant Inelastic X-ray Scattering -- Rutherford Backscattering Spectrometry -- Scanning Capacitance Microscopy -- Scanning Electrochemical Microscopy -- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry -- Scanning Electron Microscopy -- Scanning Helium Ion Microscope -- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy -- Scanning Probe Microscopy -- Scanning Transmission Electron Microscopy -- Scanning Transmission X-ray Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy -- Soft X-ray Absorption Fine Structure -- Spectroscopic Ellipsometry -- Spin- and Angle-resolved Photoelectron Spectroscopy -- Spin-Polarized Scanning Electron Microscopy -- Spin-Polarized ScanningTunneling Microscopy -- Spin-resolved Photoemission Electron Microscopy -- Super-resolution Microscopy -- Surface acoustic wave -- Surface Enhanced Raman Scattering -- Surface Magneto-optic Kerr Effect -- Surface Plasmon Resonance -- Surface Profilometer -- Surface Sensitive Scanning Electron Microscopy -- Surface X-ray Diffraction -- Surface-enhanced Infrared Absorption Spectroscopy -- Synchrotron Radiation Photoelectron Spectroscopy -- Synchrotron Scanning Tunneling Microscope -- Thermal desorption spectroscopy -- Time-of-Flight Secondary Ion Mass Spectrometry -- Time-resolved Photoelectron Spectroscopy -- Time-resolved Photoemission Electron Microscopy -- Time-resolved Scanning Tunneling Microscopy -- Tip-Enhanced Raman Scattering -- Total Reflection X-Ray Fluorescence -- Transmission Electron Diffraction -- Transmission Electron Microscope -- Ultraviolet Photoelectron Spectroscopy -- Ultraviolet-visible spectrophotometry -- Vibrational Sum Frequency Generation Spectroscopy -- X-ray Absorption Near Edge Structure -- X-ray aided noncontact atomic force microscopy -- X-ray Crystal Truncation Rod Scattering -- X-ray Magnetic Circular Dichroism -- X-ray Photoelectron Spectroscopy -- X-Ray Reflectivity -- X-ray Standing Wave Method.…”
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Theoretical Modeling of Vibrational Spectra in the Liquid Phase Yazar: Thomas, Martin

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Multiscale Materials Modeling for Nanomechanics

İçindekiler: “…Modeling Dislocation Nucleation in Nanocrystals -- 13. Quantized Crystal Plasticity Modeling of Nanocrystalline Metals -- 14. …”
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